Title :
Recent Trends in Parts SEU Susceptibility from Heavy Ions
Author :
Nichols, D.K. ; Smith, L.S. ; Price, W.E. ; Koga, R. ; Kolasinski, W.A.
Author_Institution :
Jet Propulsion Laboratory California Institute of Technology Pasadena, California
Abstract :
JPL and Aerospace have collected an extensive set of heavy ion single event upset (SEU) test data since their last joint publication in December, 1985. Trends in SEU susceptibility for state-of-the-art parts are presented.
Keywords :
Aerospace electronics; Aerospace testing; Extraterrestrial measurements; MOS devices; Manufacturing; PROM; Propulsion; Random access memory; Satellites; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1987.4337475
