• DocumentCode
    912723
  • Title

    Advantage of Advanced CMOS over Advanced TTL in a Cosmic Ray Environment

  • Author

    Sokol, Jeffrey H. ; Kolasinski, Wojciech A. ; Wong, Mannix ; Koga, Rokutano ; Suhrke, Robert V. ; Frey, Thomas H.

  • Author_Institution
    Teledyne Systems Company M/S 16 19601 Nordhoff St. Northridge, CA 91324
  • Volume
    34
  • Issue
    6
  • fYear
    1987
  • Firstpage
    1338
  • Lastpage
    1340
  • Abstract
    Samples of the 54F109, 54AS109, 54ALS109, and the 54AHCT109, as well as, the 54F374, 54AS374, 54ALS374, and the 54AHCT374 were tested at the Berkeley Cyclotron. The results indicate that the 54AHCT109 possesses a LET threshold an order of magnitude greater and a SEU cross-section that is 20 times less than its advanced TTL counterparts. The same trend was shown for the 54AHCT374 where the LET threshold was 4 times greater than that for the 54F374 while the SEU crosssection was slightly less than that of the 54F374. These results indicate substantial improvement in SEU rejection by the 54AHCT family over advanced TTL.
  • Keywords
    Aerospace testing; CMOS process; CMOS technology; Circuit testing; Cyclotrons; Energy consumption; Flip-flops; Ion beams; Single event upset; Space technology;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1987.4337476
  • Filename
    4337476
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=912723