DocumentCode
912754
Title
Chip Level Modeling of LSI Devices
Author
Armstrong, J.R.
Volume
3
Issue
4
fYear
1984
fDate
10/1/1984 12:00:00 AM
Firstpage
288
Lastpage
297
Abstract
The advent of Very Large Scale Integration (VLSI) technology has rendered the gate level model impractical for many simulation activities critical to the design automation process. As an alternative, an approach to the modeling of VLSI devices at the chip level is described, including the specification of modeling language constructs important to the modeling process. A model structure is presented in which models of LSI devices are constructed as single entities. The modeling structure is two layered. The functional layer in this structure is used to model the input/output response of the LSI chip. A second layer, the fault mapping layer, is added, if fault simulations are required, in order to map the effects of hardware faults onto the functional layer. Modeling examples for each layer are presented. Fault modeling at the chip level is described. Approaches to realistic functional fault selection and defining fault coverage for functional faults are given. Application of the modeling techniques to single chip and bit slice microprocessors is discussed.
Keywords
Acceleration; Design automation; Fault detection; Hardware; Helium; Large scale integration; Logic devices; Microprocessors; Timing; Very large scale integration;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.1984.1270087
Filename
1270087
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