• DocumentCode
    912754
  • Title

    Chip Level Modeling of LSI Devices

  • Author

    Armstrong, J.R.

  • Volume
    3
  • Issue
    4
  • fYear
    1984
  • fDate
    10/1/1984 12:00:00 AM
  • Firstpage
    288
  • Lastpage
    297
  • Abstract
    The advent of Very Large Scale Integration (VLSI) technology has rendered the gate level model impractical for many simulation activities critical to the design automation process. As an alternative, an approach to the modeling of VLSI devices at the chip level is described, including the specification of modeling language constructs important to the modeling process. A model structure is presented in which models of LSI devices are constructed as single entities. The modeling structure is two layered. The functional layer in this structure is used to model the input/output response of the LSI chip. A second layer, the fault mapping layer, is added, if fault simulations are required, in order to map the effects of hardware faults onto the functional layer. Modeling examples for each layer are presented. Fault modeling at the chip level is described. Approaches to realistic functional fault selection and defining fault coverage for functional faults are given. Application of the modeling techniques to single chip and bit slice microprocessors is discussed.
  • Keywords
    Acceleration; Design automation; Fault detection; Hardware; Helium; Large scale integration; Logic devices; Microprocessors; Timing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.1984.1270087
  • Filename
    1270087