DocumentCode :
912842
Title :
Submicron Single-Gate and Dual-Gate GaAs MESFET´s with Improved Low Noise and High Gain Performance
Author :
Ogawa, Masaki ; Ohata, Keiichi ; Furutsuka, Takashi ; Kawamura, Nobuo
Volume :
24
Issue :
6
fYear :
1976
fDate :
6/1/1976 12:00:00 AM
Firstpage :
300
Lastpage :
305
Abstract :
Microwave performance of single-gate and dual-gate GaAs MESFET´s with submicron gate structure is described. Design consideration and device technologies are also discussed. The performance of these GaAs MESFET´s exceeds previous performance with regard to lower noise and higher gain up to X band: 2.9-dB noise figure (NF) and 10.0-dB associated gain at 12 GHz for a 0.5-mu m single-gate MESFET, and 3.9-dB NF and 13.2-dB associated gain at the same frequency for a dual-gate MESFET with two 1-mu m gates.
Keywords :
Degradation; Electron devices; Fabrication; Gallium arsenide; MESFETs; Noise figure; Noise measurement; Optical films; Performance gain; Substrates;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1976.1128846
Filename :
1128846
Link To Document :
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