• DocumentCode
    912842
  • Title

    Submicron Single-Gate and Dual-Gate GaAs MESFET´s with Improved Low Noise and High Gain Performance

  • Author

    Ogawa, Masaki ; Ohata, Keiichi ; Furutsuka, Takashi ; Kawamura, Nobuo

  • Volume
    24
  • Issue
    6
  • fYear
    1976
  • fDate
    6/1/1976 12:00:00 AM
  • Firstpage
    300
  • Lastpage
    305
  • Abstract
    Microwave performance of single-gate and dual-gate GaAs MESFET´s with submicron gate structure is described. Design consideration and device technologies are also discussed. The performance of these GaAs MESFET´s exceeds previous performance with regard to lower noise and higher gain up to X band: 2.9-dB noise figure (NF) and 10.0-dB associated gain at 12 GHz for a 0.5-mu m single-gate MESFET, and 3.9-dB NF and 13.2-dB associated gain at the same frequency for a dual-gate MESFET with two 1-mu m gates.
  • Keywords
    Degradation; Electron devices; Fabrication; Gallium arsenide; MESFETs; Noise figure; Noise measurement; Optical films; Performance gain; Substrates;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1976.1128846
  • Filename
    1128846