Title :
Radiation Response of High Speed CMOS Integrated Circuits
Author :
Yue, H. ; Davison, D. ; Jennings, R.F. ; Lothongkam, P. ; Rinerson, D. ; Wyland, D.
Author_Institution :
ROLM Mil Spec Computers Corp., San Jose, CA
Abstract :
This paper studies the total dose and dose rate radiation response of the FCT family of high speed CMOS integrated circuits. Data taken on the devices is used to establish the dominant failure modes, and this data is further analyzed using one-sided tolerance factors for normal distribution statistical analysis.
Keywords :
CMOS integrated circuits; CMOS logic circuits; CMOS process; CMOS technology; Failure analysis; Logic design; Logic devices; Manufacturing processes; Radiation hardening; Substrates;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1987.4337499
