Title :
Negative resistance from velocity-saturated nonuniform semiconductor samples
Author :
Lundstr¿¿m, I. ; Wierich, R.L.
Author_Institution :
Chalmers University of Technology, Research Laboratory of Electronics, Gothenburg, Sweden
Abstract :
It is shown that a negative small-signal resistance may occur in a nonuniform semiconductor sample with ohmic contacts under a d.c. bias giving drift-velocity saturation. A circular sample is considered for convenience.
Keywords :
negative resistance effects; ohmic contacts; semiconductors; DC bias; circular samples; drift velocity saturation; negative resistance; ohmic contacts; velocity saturated nonuniform semiconductor samples;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19710141
