Title :
Hardness Assurance Based on System Reliability Models
Author :
Browning, J.S. ; Gover, J.E.
Keywords :
Circuit testing; Gaussian distribution; Guidelines; Large scale integration; Probability distribution; Radiation hardening; Reliability; Sampling methods; Statistical distributions; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1987.4337553
