DocumentCode
913729
Title
A new look at yield of integrated circuits
Author
Price, James E.
Volume
58
Issue
8
fYear
1970
Firstpage
1290
Lastpage
1291
Abstract
Expressions are derived for integrated-circuit yield as a function of active circuit area, using as a model random distributions of indistinguishable spot defects. Previous attempts to calculate integrated-circuit yield have used a nonrandom distribution of distinguishable spot defects as their model.
Keywords
Active circuits; Band pass filters; Bars; Integrated circuit modeling; Integrated circuit yield; Lithium compounds; Q measurement; Resonant frequency; Telegraphy; Temperature dependence;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1970.7911
Filename
1449841
Link To Document