Title :
Highly Reliable High-Power 86-GHz Components and Transmitter - Receiver Modules
Author :
Akaike, Masakate ; Kato, H. ; Kanmuri, N.
Abstract :
The reliability of semiconductor active devices is related to the junction temperature of diodes used. This paper describes the reliability design and performance of 86-GHz active components and transmitter-receiver modules for a guided millimeter-wave transmission system. The components are IMPATT oscillators, IMPATT amplifiers, varactor frequency multipliers, and Schottky-barrier diode upconverters. The maximum output powers of these active devices are calculated for a given mean time between failure (MTBF). Active components and transmitter-receiver modules for 86-GHz operation were manufactured based upon the design with considerations for reliability as well as RF performance.
Keywords :
Frequency; Oscillators; Power generation; Power system reliability; Radiofrequency amplifiers; Schottky diodes; Semiconductor device reliability; Semiconductor diodes; Temperature; Varactors;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1976.1128946