DocumentCode :
913962
Title :
Burst noise and microplasma noise in silicon planer transistors
Author :
Knott, K.F.
Volume :
58
Issue :
9
fYear :
1970
Firstpage :
1368
Lastpage :
1369
Abstract :
Burst-noise measurements made on discrete silicon planar transistors provide new evidence that the burst noise originates at the emitter-base junction. No support is found for the alternative theory that burst noise is associated with microplasmas in the collector-base junction.
Keywords :
Circuit noise; Circuit testing; Diodes; Discrete transforms; Fluctuations; Metalworking machines; Noise level; Noise measurement; Plasma measurements; Silicon;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1970.7934
Filename :
1449864
Link To Document :
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