A Meyer-Like Approach for the Transient Analysis of Digital MOS IC´s

It is well known that Meyer´s model for the MOST implemented in SPICE does not guarantee charge conservation, while Ward´s model seems somewhat complex to be used as a standard for the transient analysis of all the MOS circuits. In this work, a new simple MOST model for the transient analysis of MOS integrated circuits is presented. The model was developed by performing the numerical integration of the gate current as a first step without introducing the concept of a mean constant capacitance. The new model has been implemented in the program SGS-SPICE. All benchmark tests indicate that it conserves the charge at all the terminals of the MOS transistor.