• DocumentCode
    914245
  • Title

    A Statistical Design Rule Developer

  • Author

    Razdan, Rahul ; Strojwas, Andrzej J.

  • Author_Institution
    Digital Equipment Corporation, Hudson, MA, USA
  • Volume
    5
  • Issue
    4
  • fYear
    1986
  • fDate
    10/1/1986 12:00:00 AM
  • Firstpage
    508
  • Lastpage
    520
  • Abstract
    In this paper, a general methodology for design rule development and the CAD tool which implements this methodology, Statistical Design Rule Developer (STRUDEL), are presented. The focus of the proposed approach is the concept of a statistical design rule, which is defined as a geometric design rule with an associated probability of failure. Global lateral variations obtained from FABRICS, and local spot defects obtained from measurements are taken into account when calculating the probability of failure. A failure model which accounts for catastrophic faults has been enhanced to include some parametric faults. STRUDEL can be used as a guide to generate layout design rules and may be extended to a wide range of applications including coarse yield estimation during design rules check.
  • Keywords
    Design automation; Design methodology; Fabrics; Helium; MOS devices; Probability; Random access memory; Silicon; Very large scale integration; Yield estimation;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.1986.1270222
  • Filename
    1270222