DocumentCode :
914742
Title :
Space Compression Methods With Output Data Modification
Author :
Li, Yiu Kei ; Robinson, John P.
Author_Institution :
Sperry Corporation, St. Paul, MN, USA
Volume :
6
Issue :
2
fYear :
1987
fDate :
3/1/1987 12:00:00 AM
Firstpage :
290
Lastpage :
294
Abstract :
The main advantages of space compression are the reduction in the number of pins monitored by the tester and the minimization of the memory space required for reference signatures. Compression, however, may reduce fault coverage. We investigate output data modification with the objective to improve the efficiency of syndrome testing and to reduce by a significant amount the error probability. It was found that this approach to output modification depends strongly upon the functions tested and may result in a complicated testing circuit, in some cases. A design algorithm is proposed which combines space compression and output modification. This algorithm will often minimize the disadvantages of both approaches while maintaining error coverage information.
Keywords :
Automatic testing; Circuit faults; Circuit testing; Combinational circuits; Data compression; Linear feedback shift registers; Sequential circuits; Silicon; Space technology; Very large scale integration;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.1987.1270273
Filename :
1270273
Link To Document :
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