Title :
Space Compression Methods With Output Data Modification
Author :
Li, Yiu Kei ; Robinson, John P.
Author_Institution :
Sperry Corporation, St. Paul, MN, USA
fDate :
3/1/1987 12:00:00 AM
Abstract :
The main advantages of space compression are the reduction in the number of pins monitored by the tester and the minimization of the memory space required for reference signatures. Compression, however, may reduce fault coverage. We investigate output data modification with the objective to improve the efficiency of syndrome testing and to reduce by a significant amount the error probability. It was found that this approach to output modification depends strongly upon the functions tested and may result in a complicated testing circuit, in some cases. A design algorithm is proposed which combines space compression and output modification. This algorithm will often minimize the disadvantages of both approaches while maintaining error coverage information.
Keywords :
Automatic testing; Circuit faults; Circuit testing; Combinational circuits; Data compression; Linear feedback shift registers; Sequential circuits; Silicon; Space technology; Very large scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.1987.1270273