• DocumentCode
    914742
  • Title

    Space Compression Methods With Output Data Modification

  • Author

    Li, Yiu Kei ; Robinson, John P.

  • Author_Institution
    Sperry Corporation, St. Paul, MN, USA
  • Volume
    6
  • Issue
    2
  • fYear
    1987
  • fDate
    3/1/1987 12:00:00 AM
  • Firstpage
    290
  • Lastpage
    294
  • Abstract
    The main advantages of space compression are the reduction in the number of pins monitored by the tester and the minimization of the memory space required for reference signatures. Compression, however, may reduce fault coverage. We investigate output data modification with the objective to improve the efficiency of syndrome testing and to reduce by a significant amount the error probability. It was found that this approach to output modification depends strongly upon the functions tested and may result in a complicated testing circuit, in some cases. A design algorithm is proposed which combines space compression and output modification. This algorithm will often minimize the disadvantages of both approaches while maintaining error coverage information.
  • Keywords
    Automatic testing; Circuit faults; Circuit testing; Combinational circuits; Data compression; Linear feedback shift registers; Sequential circuits; Silicon; Space technology; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.1987.1270273
  • Filename
    1270273