DocumentCode
914742
Title
Space Compression Methods With Output Data Modification
Author
Li, Yiu Kei ; Robinson, John P.
Author_Institution
Sperry Corporation, St. Paul, MN, USA
Volume
6
Issue
2
fYear
1987
fDate
3/1/1987 12:00:00 AM
Firstpage
290
Lastpage
294
Abstract
The main advantages of space compression are the reduction in the number of pins monitored by the tester and the minimization of the memory space required for reference signatures. Compression, however, may reduce fault coverage. We investigate output data modification with the objective to improve the efficiency of syndrome testing and to reduce by a significant amount the error probability. It was found that this approach to output modification depends strongly upon the functions tested and may result in a complicated testing circuit, in some cases. A design algorithm is proposed which combines space compression and output modification. This algorithm will often minimize the disadvantages of both approaches while maintaining error coverage information.
Keywords
Automatic testing; Circuit faults; Circuit testing; Combinational circuits; Data compression; Linear feedback shift registers; Sequential circuits; Silicon; Space technology; Very large scale integration;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.1987.1270273
Filename
1270273
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