• DocumentCode
    914876
  • Title

    RFSIM: Reduced Fault Simulator

  • Author

    Nishida, Takao ; Miyamoto, Shunsuke ; Kozawa, Tokinori ; Satoh, Katsuya

  • Author_Institution
    Central Research Laboratory, Hitachi Ltd., Tokyo, Japan
  • Volume
    6
  • Issue
    3
  • fYear
    1987
  • fDate
    5/1/1987 12:00:00 AM
  • Firstpage
    392
  • Lastpage
    402
  • Abstract
    This paper describes the algorithm, implementation, and evaluation results of a new fault simulator called RFSIM, which is designed for combinational circuits. In order to accelerate fault simulation, two basic principles are introduced, a Detectable Fault Only (DFO) principle and a Candidate Gate Once (CGO) principle. The DFO principle is a dynamic reduction algorithm, which aims at drastically reducing computational complexity by utilizing blocking gate information. The CGO principle is an implementation technique which is utilized to implement the DFO principle effectively. Experimental results show that RFSIM is more than 10 times faster than a conventional concurrent fault simulator, and confirms that the DFO principle contributes to a drastic reduction in the number of faults to be simulated. A fault reduction ratio of around 25 to 1 was achieved in one of the benchmark circuits.
  • Keywords
    Acceleration; Algorithm design and analysis; Circuit faults; Circuit simulation; Combinational circuits; Computational complexity; Computational modeling; Electrical fault detection; Fault detection; Heuristic algorithms;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.1987.1270284
  • Filename
    1270284