DocumentCode
914876
Title
RFSIM: Reduced Fault Simulator
Author
Nishida, Takao ; Miyamoto, Shunsuke ; Kozawa, Tokinori ; Satoh, Katsuya
Author_Institution
Central Research Laboratory, Hitachi Ltd., Tokyo, Japan
Volume
6
Issue
3
fYear
1987
fDate
5/1/1987 12:00:00 AM
Firstpage
392
Lastpage
402
Abstract
This paper describes the algorithm, implementation, and evaluation results of a new fault simulator called RFSIM, which is designed for combinational circuits. In order to accelerate fault simulation, two basic principles are introduced, a Detectable Fault Only (DFO) principle and a Candidate Gate Once (CGO) principle. The DFO principle is a dynamic reduction algorithm, which aims at drastically reducing computational complexity by utilizing blocking gate information. The CGO principle is an implementation technique which is utilized to implement the DFO principle effectively. Experimental results show that RFSIM is more than 10 times faster than a conventional concurrent fault simulator, and confirms that the DFO principle contributes to a drastic reduction in the number of faults to be simulated. A fault reduction ratio of around 25 to 1 was achieved in one of the benchmark circuits.
Keywords
Acceleration; Algorithm design and analysis; Circuit faults; Circuit simulation; Combinational circuits; Computational complexity; Computational modeling; Electrical fault detection; Fault detection; Heuristic algorithms;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.1987.1270284
Filename
1270284
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