DocumentCode :
914876
Title :
RFSIM: Reduced Fault Simulator
Author :
Nishida, Takao ; Miyamoto, Shunsuke ; Kozawa, Tokinori ; Satoh, Katsuya
Author_Institution :
Central Research Laboratory, Hitachi Ltd., Tokyo, Japan
Volume :
6
Issue :
3
fYear :
1987
fDate :
5/1/1987 12:00:00 AM
Firstpage :
392
Lastpage :
402
Abstract :
This paper describes the algorithm, implementation, and evaluation results of a new fault simulator called RFSIM, which is designed for combinational circuits. In order to accelerate fault simulation, two basic principles are introduced, a Detectable Fault Only (DFO) principle and a Candidate Gate Once (CGO) principle. The DFO principle is a dynamic reduction algorithm, which aims at drastically reducing computational complexity by utilizing blocking gate information. The CGO principle is an implementation technique which is utilized to implement the DFO principle effectively. Experimental results show that RFSIM is more than 10 times faster than a conventional concurrent fault simulator, and confirms that the DFO principle contributes to a drastic reduction in the number of faults to be simulated. A fault reduction ratio of around 25 to 1 was achieved in one of the benchmark circuits.
Keywords :
Acceleration; Algorithm design and analysis; Circuit faults; Circuit simulation; Combinational circuits; Computational complexity; Computational modeling; Electrical fault detection; Fault detection; Heuristic algorithms;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.1987.1270284
Filename :
1270284
Link To Document :
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