DocumentCode :
914944
Title :
Evaluating layout area tradeoffs for high level applications
Author :
Kurdahi, Fadi J. ; Ramachandran, Champaka
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
Volume :
1
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
46
Lastpage :
55
Abstract :
The authors address the problem of evaluating area tradeoffs for VLSI layouts from high-level specifications (typically register-transfer level). An area prediction approach based on two models, analytical and constructive, are presented. A circuit design is partitioned recursively down to a level specified by the user, thus generating a slicing tree. An analytical model is then used to predict the shape function of each of the leaf subcircuits. By traversing the tree in post-order, the shape function of the entire layout design can be predicted constructively. This approach also permits the user to trade off the accuracy of the prediction versus the runtime of the predictor. Such a scheme is quite useful for high level design tasks. The authors show experimentally that the estimates obtained using this model are within 5% of the actual layout area for designs ranging from 125 to 12000 cells.<>
Keywords :
VLSI; cellular arrays; circuit layout CAD; VLSI layouts; analytical model; area prediction; cellular arrays; circuit design; constructive model; high level applications; high level design tasks; high-level specifications; layout area tradeoffs; leaf subcircuits; partitioning; register-transfer level; slicing tree; Accuracy; Analytical models; Circuit synthesis; Costs; Phase estimation; Predictive models; Process design; Runtime; Shape; Very large scale integration;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.219906
Filename :
219906
Link To Document :
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