Title :
Characteristic impedance measurements of a coplanar waveguide
Author_Institution :
Toshiba Corporation, Research & Development Center, Kawasaki, Japan
Abstract :
A coplanar waveguide which consists of a strip of metallic thin film on the surface of a dielectric slab with two ground electrodes running adjacent and parallel to the strip is easily accessible for shunt connections of semiconductor devices. This letter presents experimental data, and a theoretical equation including correction factors, for an effective relative permittivity concerning characteristic impedance. The measurements have been made by the t.d.r. method.
Keywords :
electric impedance measurement; microwave measurement; permittivity measurement; strip lines; time-domain analysis; characteristic impedance measurements; coplanar waveguide; correction factors; effective relative permittivity; microwave integrated circuits; permittivity measurement; striplines; time domain reflectometry;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19710463
