Title : 
Automatic testing of high resolution time digitizers
         
        
            Author : 
Kolbe, William F. ; Turko, Bojan
         
        
            Author_Institution : 
Lawrence Berkeley Lab., California Univ., Berkeley, CA, USA
         
        
        
        
        
        
        
            Abstract : 
An automated system for the testing and performance evaluation of high-resolution, long-range time digitizers is described. The test system uses an IBM PC/XT or PC/AT personal computer together with appropriate hardware interfacing modules to control the digitizer under test. Precise timing intervals for testing are generated by a pulse-calibration module driven by a programmable low-phase-noise frequency synthesizer. The time intervals measured by the digitizer are compared under computer control with the actual intervals produced by the synthesizer for a sufficient number of cases to establish the digitizer performance. The hardware and software components used are discussed.<>
         
        
            Keywords : 
analogue-digital conversion; automatic test equipment; electronic equipment testing; microcomputer applications; time measurement; IBM PC/XT; PC/AT; automated system; electronic equipment testing; high resolution time digitizers; performance evaluation; programmable low-phase-noise frequency synthesizer; pulse-calibration module; testing; Automatic control; Automatic testing; Control systems; Frequency synthesizers; Hardware; Microcomputers; Pulse generation; System testing; Time measurement; Timing;
         
        
        
            Journal_Title : 
Nuclear Science, IEEE Transactions on