Title :
Computer-aided determination of two-port noise parameters (CADON)
Author :
Kotyczka, W. ; Leupp, A. ; Strutt, M.J.O.
Abstract :
With a desk computer the noise and gain parameters of a two-port can be determined with high speed and reasonable accuracy from a well-known noise figure measurement process.
Keywords :
Admittance measurement; Capacitance measurement; Epitaxial layers; Integrated circuit noise; MOS capacitors; Noise figure; Noise measurement; Solid state circuits; Substrates; Testing;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1970.8034
