Title :
Techniques for time-domain analysis of L.S.I. circuits
Author :
Sangiovanni-Vincentelli, A.L. ; Rabbat, N.B.G.
Author_Institution :
IBM, T.J. Watson Research Center, Yorktown Heights, USA
fDate :
12/1/1980 12:00:00 AM
Abstract :
The concept of nested macromodels is introduced to take advantage of the structural properties of large-scale integrated circuits. A multilevel algorithm for the analysis of circuits contanining nested macro-models is presented and its implementation is discussed.
Keywords :
circuit analysis computing; large scale integration; semiconductor device models; time-domain analysis; LSI circuits; multilevel algorithm; nested macromodels; time domain analysis;
Journal_Title :
Electronic Circuits and Systems, IEE Proceedings G
DOI :
10.1049/ip-g-1:19800049
