Title :
Frequency dependence of negative-capacitance effects observed in amorphous semiconductor thin-film devices
Author :
Allison, J. ; Dawe, V.R.
Author_Institution :
University of Sheffield, Department of Electronic & Electrical Engineering, Sheffield, UK
Abstract :
A simple thermal model is analysed which explains the observed frequency dependence of the negative capacitance of chalcogenide-glass threshold switches at room temperature.
Keywords :
capacitance; semiconductor devices; semiconductor materials; semiconductor switches; semiconductor thin films; thin film devices; amorphous semiconductor thin film devices; chalcogenide glass threshold switches; frequency dependence of negative capacitance effects; room temperature; thermal model;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19710484
