• DocumentCode
    915223
  • Title

    Frequency dependence of negative-capacitance effects observed in amorphous semiconductor thin-film devices

  • Author

    Allison, J. ; Dawe, V.R.

  • Author_Institution
    University of Sheffield, Department of Electronic & Electrical Engineering, Sheffield, UK
  • Volume
    7
  • Issue
    24
  • fYear
    1971
  • Firstpage
    706
  • Lastpage
    707
  • Abstract
    A simple thermal model is analysed which explains the observed frequency dependence of the negative capacitance of chalcogenide-glass threshold switches at room temperature.
  • Keywords
    capacitance; semiconductor devices; semiconductor materials; semiconductor switches; semiconductor thin films; thin film devices; amorphous semiconductor thin film devices; chalcogenide glass threshold switches; frequency dependence of negative capacitance effects; room temperature; thermal model;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19710484
  • Filename
    4235390
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=915223