Title :
Metal--Metal Matrix (M 3) for High-Speed MOS VLSI Layout
Author_Institution :
Coordinated Science Laboratory and the Department of Electrical and Computer Engineering, University of Illinois, Urbana, IL, USA
fDate :
9/1/1987 12:00:00 AM
Abstract :
This paper proposes a new layout method for high-speed VLSI circuits in single-poly and double-metal MOS technology. With emphasis on the speed performance, our Metal-Metal Matrix (M 3) layout method employs maximal use of metal interconnections while restricting delay-consuming polysilicon or polycide features only to form MOS transistor gates or to connect the same type of transistor gates with common input signals. M 3 layout is also amenable to submicron technology trends and existing CAD tools for single-poly and single-metal chip assembly and routing. Our layout studies indicate that M 3 is particularly appealing to high-speed dynamic CMOS circuits in view of packing density and speed performance. This new structure has not been experimented with VLSI chip fabrication yet and awaits empirical verification.
Keywords :
Aluminum; CMOS logic circuits; CMOS technology; Chip scale packaging; Delay; Logic design; Logic devices; MOSFETs; Routing; Very large scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.1987.1270331