Title :
Noise measurements at audio and subaudio frequencies using statistical analysis
Author :
Haslett, J.W. ; Dennis, L.P. ; Trofimenkoff, F.N.
Abstract :
A fast method of measuring the power spectral density of transistor noise from dc to 10 kHz is described. The method is based on digital analysis of sampled data, and is applicable to a wide variety of noise measurements.
Keywords :
Density measurement; Frequency measurement; Low-frequency noise; Magnetic analysis; Noise measurement; Poles and zeros; Power measurement; Radio frequency; Sampling methods; Statistical analysis;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1970.8056
