Title :
Experimental Measurement of Microstrip Transistor-Package Parasitic Reactances
Author :
Akello, Robert J. ; Easter, Brian ; Stephenson, I.M.
fDate :
5/1/1977 12:00:00 AM
Abstract :
A resonance method of measurement is described for the determination of the parasitic reactance of a microwave transistor package mounted in microstrip. Results for two types of package obtained from normal-sized and from scaled-up models are presented. The influence of the parasitic on the characteristics of a typical microwave FET chip is briefly discussed.
Keywords :
Circuits; Electronics packaging; Ferrites; Microstrip; Microwave FETs; Microwave devices; Microwave measurements; Microwave theory and techniques; Resonance; Semiconductor device packaging;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1977.1129105
