Title :
Microwave transmission method for measuring minority-carrier lifetime in silicon slices
Author :
Thomas, R.E. ; Makios, V. ; Ogletree, S. ; Mckillican, R.
Author_Institution :
Carleton University, Faculty of Engineering, Ottawa, Canada
Abstract :
A microstrip transmission method is described for measuring minority-carrier lifetime in thin silicon slices. This method is used to correct results published earlier by Makios and Thomas, using the HP 8410 network analyser as a microwave interferometer. Measured results for high-resistivity samples are shown to extend the earlier curves of Ross and Madigan.
Keywords :
microwave measurement; semiconductor materials; Si clices; microwave transmission method; minority carrier lifetime measurement; semiconductor materials;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19710516
