DocumentCode :
916194
Title :
Highly linear 0.18-μm CMOS power amplifier with deep n-Well structure
Author :
Kang, Jongchan ; Yu, Daekyu ; Yang, Youngoo ; Kim, Bumman
Author_Institution :
Pohang Inst. of Sci. & Technol., South Korea
Volume :
41
Issue :
5
fYear :
2006
fDate :
5/1/2006 12:00:00 AM
Firstpage :
1073
Lastpage :
1080
Abstract :
The linearity of a 0.18-μm CMOS power amplifier (PA) is improved by adopting a deep n-well (DNW). To find the reason for the improvement, bias dependent nonlinear parameters of the test devices are extracted from a small-signal model and a Volterra series analysis for an optimized nMOS PA with a proper matching circuit is carried out. From the analysis, it is revealed that the DNW of the nMOS lowers the harmonic distortion generated from the intrinsic gate-source capacitance (Cgs), which is the dominant nonlinear source, and partially from drain junction capacitance (Cjd). Single-ended and differential PAs for 2.45-GHz WLAN are designed and fabricated using a 0.18-μm standard CMOS process. The single-ended PA with the DNW improves IMD3 and IMD5 about 5 dB with identical power performances, i.e., 20 dBm of Pout, 18.7 dB of power gain and 31% of power-added efficiency (PAE) at P1dB. The IMD3 and IMD5 are below -40 dBc and -47dBc, respectively. The differential PA with the DNW also shows about 7 dB improvements of IMD3 and IMD5 with 20.2 dBm of Pout, 18.9 dB of power gain and 35% of PAE at P1dB. The IMD3 and IMD5 are below -45 dB and -57 dBc, respectively. These performances of the linear PAs are state-of-the-art results.
Keywords :
CMOS analogue integrated circuits; UHF integrated circuits; UHF power amplifiers; differential amplifiers; harmonic distortion; wireless LAN; 0.18 micron; 18.7 dB; 18.9 dB; 2.45 GHz; 20 dB; 5 dB; CMOS power amplifier; IMD3; IMD5; Volterra series; deep n-well structure; differential power amplifier; drain junction capacitance; harmonic distortion; intrinsic gate-source capacitance; nMOS power amplifier; power-added efficiency; single-ended power amplifier; wireless LAN; Capacitance; Circuit testing; Gain; Harmonic analysis; Harmonic distortion; High power amplifiers; Linearity; MOS devices; Power amplifiers; Semiconductor device modeling; Class AB; IMD3; IMD5; Volterra series; deep n-well (DNW); differential PA; harmonic distortion; single-ended PA;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2006.874059
Filename :
1624396
Link To Document :
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