DocumentCode :
916355
Title :
Diagnosis of DES With Petri Net Models
Author :
Lefebvre, Dimitri ; Delherm, Catherine
Author_Institution :
Le Havre Univ.
Volume :
4
Issue :
1
fYear :
2007
Firstpage :
114
Lastpage :
118
Abstract :
The diagnosis of discrete event systems is strongly related to events estimation. This paper focuses on faulty behaviors modeled with ordinary Petri nets with some "fault" transitions. Partial but unbiased measurement of the places marking variation is used in order to estimate the firing sequences. The main contribution is to decide which sets of places must be observed for the exact estimation of some given firing sequences. Minimal diagnosers are defined that detect and isolate the firing of fault transitions immediately. Causality relationships and directed paths are also investigated to characterize the influence and dependence areas of the fault transitions. Delayed diagnosers are obtained as a consequence. Note to Practitioners-Structural tools are provided for the analysis of models used in the context of fault detection and isolation for discrete event systems. The systems that are concerned are either manufacturing processes, batch processes, digital devices, or communication protocols with single or multiple failures. Methods are proposed to decide, in a systematic way, if the considered failures can be detected and isolated according to the existing sensors. The obtained results can also be used by designers for sensor selection
Keywords :
Petri nets; discrete event systems; fault diagnosis; Petri net models; causality relationships; discrete event systems; events estimation; fault diagnosis; fault transitions; Context modeling; Delay estimation; Discrete event systems; Event detection; Fault detection; Fault diagnosis; Manufacturing processes; Petri nets; Protocols; Sensor phenomena and characterization; Discrete event systems (DES); Petri nets; estimation; fault diagnosis;
fLanguage :
English
Journal_Title :
Automation Science and Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
1545-5955
Type :
jour
DOI :
10.1109/TASE.2006.872122
Filename :
4049767
Link To Document :
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