Title :
Stability theory for thin Gunn diodes with dielectric surface loading
Author :
Hofmann, Karl Rudiger
Author_Institution :
Philips Research Laboratories, NV Philips´ Gloeilampenfabrieken, Eindhoven, Netherlands
Abstract :
The critical nd product for the suppression of Gunn oscillations in transversely thin diodes has been derived as a function of the dielectric surface loading. For permittivities of the dielectric higher than about one and a half times that of the active medium, a saturation of (nd)crit towards the infinite-surface-loading value is found.
Keywords :
Gunn diodes; stability; Gunn oscillations; dielectric surface loading; stability; transversely thin diodes;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19720089
