Title :
Measurement of EMI induced input offset voltage of an operational amplifier
Author :
Redoute, Jean-Michel ; Steyaert, M.
Author_Institution :
Katholieke Univ. Leuven, Leuven
Abstract :
An efficient measurement technique is introduced for determining the input referred offset voltage induced by electromagnetic interference (EMI) in operational amplifiers.
Keywords :
electric noise measurement; electromagnetic interference; operational amplifiers; EMI measurement; electromagnetic interference; operational amplifier;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20071017
