DocumentCode :
916977
Title :
Application of the method of potential functions to fault diagnosis
Author :
Sriyananda, H.
Author_Institution :
University of Wales Institute of Science & Technology, Dynamic Analysis Group, Cardiff, UK
Volume :
8
Issue :
6
fYear :
1972
Firstpage :
159
Lastpage :
160
Abstract :
A new technique for estimating parameter drift, based on the method of potential functions, is suggested. When one of the parameters has a very much larger drift than the others, thus constituting a fault, it has been found possible to isolate this parameter as the one with the largest estimated drift, even though the sensitivity functions associated with the parameters are not orthogonal.
Keywords :
estimation theory; failure analysis; recursive functions; fault diagnosis; parameter drift; parameter estimation; potential functions technique; recursive estimation;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19720117
Filename :
4235565
Link To Document :
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