DocumentCode :
917056
Title :
A 0.1–5 GHz Cryogenic SiGe MMIC LNA
Author :
Bardin, Joseph C. ; Weinreb, Sander
Author_Institution :
California Inst. of Technol., Pasadena, CA
Volume :
19
Issue :
6
fYear :
2009
fDate :
6/1/2009 12:00:00 AM
Firstpage :
407
Lastpage :
409
Abstract :
In this letter, the design and measurement of the first SiGe integrated-circuit LNA specifically designed for operation at cryogenic temperatures is presented. At room temperature, the circuit provides greater than 25.8 dB of gain with an average noise temperature (Te) of 76 K (NF = 1 dB) and S11 of -9 dB for frequencies in the 0.1-5 GHz band. At 15 K, the amplifier has greater than 29.6 dB of gain with an average Te of 4.3 K and S11 of -14.6 dB for frequencies in the 0.1-5 GHz range. To the authors´ knowledge, this is the lowest noise ever reported for a silicon integrated circuit operating in the low microwave range and the first matched wideband cryogenic integrated circuit LNA that covers frequencies as low as 0.1 GHz.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; MMIC amplifiers; bipolar MMIC; cryogenic electronics; low noise amplifiers; BiCMOS8HP process; HBT; SiGe; cryogenic MMIC LNA; frequency 0.1 GHz to 5 GHz; heterojunction bipolar transistor; integrated-circuit LNA; low-noise amplifier; silicon integrated circuit; temperature 15 K; temperature 293 K to 298 K; temperature 76 K; wideband LNA; BiCMOS; SiGe; cryogenic; heterojunction bipolar transistors (HBT); integrated circuit (IC); low temperature; low-noise amplifier (LNA); noise;
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/LMWC.2009.2020041
Filename :
4982544
Link To Document :
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