Title : 
Measurement of electron attachment processes in a high-temperature plasma
         
        
            Author : 
Mullen, John H. ; Madson, James M. ; Medgyesi-mitschang, Louis N.
         
        
            Author_Institution : 
McDonnell Douglas Research Laboratories, St. Louis, Mo.
         
        
        
        
        
            fDate : 
4/1/1971 12:00:00 AM
         
        
        
        
            Abstract : 
An experimental technique has been developed for measuring rate constants of electron attaching reactions as well as ion-molecule reactions in plasma at 2000-3000°K. Reaction product ions are mass analyzed and rate constants are obtained from plots of the collected ion current. The rate constant for O-formation from N2O varies from about 3 to 9×10-9cm3/s over the temperature range of 2400-3000°K while the rate constant for F-formation from SF6varies from 2.8 to 4×10-10cm3/s for temperatures from 2775 to 3000°K. A brief survey of experimental techniques for measuring electron attachment rate constants at lower temperatures is also given, together with a comparison of these rate constants and present high-temperature values.
         
        
            Keywords : 
Argon; Electrons; Extraterrestrial measurements; Plasma density; Plasma measurements; Plasma sources; Plasma temperature; Plasma waves; Temperature distribution; Vehicles;
         
        
        
            Journal_Title : 
Proceedings of the IEEE
         
        
        
        
        
            DOI : 
10.1109/PROC.1971.8222