DocumentCode :
917618
Title :
Book Reviews: Test Tutorials in Book Form
Author :
Davidson, Scott
Author_Institution :
Sun Microsystems
Volume :
24
Issue :
5
fYear :
2007
Firstpage :
506
Lastpage :
507
Abstract :
This is a review of Advances in Electronic Testing: Challenges and Methodologies (edited by Dimitris Gizopoulos), which is part of a series called Frontiers in Electronic Testing. This book can be thought of as a set of advanced tutorials in book form. One of the best things about this book is that several chapters go beyond the what of the subject and into the why. The book is also well integrated, with pointers to other chapters when necessary and with a minimum overlap between chapters.
Keywords :
Application software; Book reviews; Built-in self-test; Computer architecture; Costs; Delay; Design for testability; Electronic equipment testing; Radio frequency; Sections; ATE; DFT; advances in electronic testing; methodologies; tutorials;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2007.154
Filename :
4338475
Link To Document :
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