Title :
An Analysis of Microwave De-Embedding Errors (Technical Notes)
Author :
Glasser, Lance A.
fDate :
5/1/1978 12:00:00 AM
Abstract :
Bounds on de-embedding errors are derived. Both measurement errors and "known" load errors are considered. Of particular interest is the determination of error bounds for unknown loads situated in regions of the Smith chart that are remote from the location of the known de-embedding loads. An example is presented. This analysis is of particular interest for de-embedding microwave diodes.
Keywords :
Computer errors; Diodes; Error analysis; Laboratories; MOS capacitors; Measurement standards; Microwave technology; Packaging; Reflection; Scattering parameters;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1978.1129395
