DocumentCode :
918768
Title :
Effect of Alteration of Antioxidant by UV Treatment on the Dielectric Strength of BOPP Capacitor Film
Author :
Ho, Janet ; Ramprasad, Ramamurthy ; Boggs, Steven
Author_Institution :
Univ. of Connecticut, Storrs
Volume :
14
Issue :
5
fYear :
2007
fDate :
10/1/2007 12:00:00 AM
Firstpage :
1295
Lastpage :
1301
Abstract :
The effect of altered products of the antioxidant by UV irradiation on dielectric breakdown strength of metallized biaxially-oriented polypropylene (BOPP) capacitor film was studied. Results from Weibull statistical analysis show that an optimal UV exposure level of ~3.4 J/cm2 (200-400 nm) increases the breakdown strength at 5% probability by ~20%. As indicated by UV spectroscopic analysis, the antioxidant in BOPP was consumed almost entirely to form 2,6-di-tert-butyl-p-benzoquinone (2,6-DTB-PBQ). Density functional theory computations indicate that this compound is electronegative, which probably accounts for the increased dielectric strength.
Keywords :
Weibull distribution; density functional theory; electric breakdown; organic compounds; thin film capacitors; ultraviolet spectroscopy; 2,6 DTB PBQ; BOPP capacitor film; UV spectroscopic analysis; UV treatment; Weibull statistical analysis; alteration effect; antioxidant; density functional theory; dielectric breakdown strength; dielectric strength; metallized biaxially oriented polypropylene capacitor film; Capacitors; Dielectric breakdown; Dielectric measurements; Electric breakdown; Electrodes; Lamps; Light sources; Metallization; Optical films; Testing;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2007.4339492
Filename :
4339492
Link To Document :
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