DocumentCode :
918900
Title :
On the linear theory of noise in read diodes
Author :
Convert, G.
Volume :
59
Issue :
8
fYear :
1971
Firstpage :
1265
Lastpage :
1266
Abstract :
The linear theory of the noise of Read diodes is extended to the case of different ionizing coefficients for electrons and holes and a finite multiplication factor. It is shown that the noise is smallest when the carriers injected in the avalanche region are of the less strongly ionizing type.
Keywords :
Bonding processes; Charge carrier processes; Diodes; Fabrication; Internal stresses; Ionization; Lattices; Noise generators; Quality control; Testing;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1971.8385
Filename :
1450315
Link To Document :
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