Title :
Testable switched-capacitor filters
Author :
Huertas, José L. ; Rueda, Adoración ; Vázquez, Diego
Author_Institution :
Dept. Diseno Analogico, Sevilla Univ., Spain
fDate :
7/1/1993 12:00:00 AM
Abstract :
A design-for-testability (DFT) methodology for switched-capacitor (SC) filters is presented, based on an architecture using some additional circuitry and providing extra capabilities for both off- and online test. A programmable biquad is used for on-chip comparison of the transfer functions for every filter stage. Test area overhead consists of the programmable biquad, a set of switches, and a finite-sequential-machine (FSM) control part. The design and implementation of an example filter are included to assess the potential usefulness of this approach
Keywords :
design for testability; network synthesis; switched capacitor filters; transfer functions; FSM control part; design-for-testability; finite-sequential-machine; programmable biquad; switched-capacitor filters; testable SC filters; transfer functions; Built-in self-test; Circuit testing; Design for testability; Design methodology; Filters; Life testing; Prototypes; Signal processing; System testing; Transfer functions;
Journal_Title :
Solid-State Circuits, IEEE Journal of
