Title :
On configurable oversampled A/D converters
Author :
Nys, Olivier J A P ; Dijkstra, Evert
Author_Institution :
Swiss Center for Electron. & Microtechnol., Neuchatel, Switzerland
fDate :
7/1/1993 12:00:00 AM
Abstract :
An oversampled A/D (analog-to-digital) converter that can be configured as either a sigma-delta converter or an incremental converter is presented. This is an oversampled instrumentation converter that cancels offset and 1/f noise. The converter architecture is based on a mixed analog-digital integrator (MADI) concept. This concept is shown to lead to a very simple and modular architecture. The implemented converter also allows selection of the converter order and the decimation factor in order to find the best tradeoff between resolution, conversion time or bandwidth, and power consumption. As the converter architecture is completely modular, it can rapidly be tailored for a specific application with minimized silicon area. The circuit achieves a resolution of 16 b on a range of ±650 mV and compensates the offset and the even-order harmonics to a nonobservable level
Keywords :
CMOS integrated circuits; analogue-digital conversion; delta modulation; mixed analogue-digital integrated circuits; 1/f noise; ADC; Si; bandwidth; conversion time; converter architecture; converter order; decimation factor; incremental converter; mixed analog-digital integrator; modular architecture; offset noise cancellation; oversampled A/D converters; oversampled instrumentation converter; power consumption; resolution; sigma-delta converter; Analog-digital conversion; Bandwidth; Delta-sigma modulation; Digital filters; Energy consumption; Instruments; Multi-stage noise shaping; Noise cancellation; Stability; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
