Title :
Thermal analysis of preswitching characteristics of a thin-film amorphous-chalcogenide switch
Author :
Thomas, C.B. ; Carew-Jones, R. ; Bosnell, J.
Author_Institution :
Royal Radar Establishment, Great Malvern, UK
Abstract :
The preswitching nonohmic behaviour of amorphous-semiconductor switches could result from either Joule heating or space-charge-limited currents. After the `forming¿ of a virgin device, electron-microscope examinations have revealed a channel whose composition differs significantly from the matrix. Also, the I/V characteristics of the blocking states of virgin and formed devices are significantly different. The preswitching I/V characteristics of a Ge15Te81S4 chalcogenide-glass switch at 300 K have been explained by Joule heating in the formed channel, with an estimated temperature rise of 25 degC above ambient at the centre of a monostable switch.
Keywords :
heating; semiconductor switches; thin film devices; Ge; I/V characteristics; Joule heating; S; Te; electron microscope examination; glass; preswitching characteristics; semiconductor switches; thermal analysis; thin film amorphous chalcogenide switch;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19720324