Title :
Diffraction From A Material Loaded Tandem Slit
Author :
Seran, Santosh ; Donohoe, J. Patrick ; Topsakal, Erdem
Author_Institution :
Dept. of Electr. & Comput. Eng., Mississippi State Univ., Starkville, MS, USA
Abstract :
In this paper, we consider plane wave diffraction by a tandem slit loaded with a homogenous material. The boundary value problem is formulated into a pair of simultaneous Wiener-Hopf equations via Fourier transformation. After decoupling these equations by elementary transformation, each modified Wiener-Hopf equation is reduced to a Fredholm integral equation of the second kind. The integral equations are then solved approximately to yield the Fourier transform of the diffracted fields. The inverse transform is evaluated asymptotically to obtain the far field expressions. Measurements and numerical simulations are also performed for several different geometry and material configurations. The analytic solutions compare well with measured and simulated results. The possibility of reducing beamwidth and increasing power coupled through the loaded tandem slit is explored.
Keywords :
Fourier transforms; Fredholm integral equations; boundary-value problems; electromagnetic wave diffraction; microwave propagation; Fourier transformation; Fredholm integral equation; Wiener-Hopf equation; boundary value problem; elementary transformation; inverse transform; material loaded tandem slit; numerical simulation; plane wave diffraction; Band pass filters; Bandwidth; Bifurcation; Boundary value problems; Dielectric materials; Diffraction; Fourier transforms; Integral equations; Numerical simulation; Optical coupling; Diffraction; Weiner Hopf; tandem slit;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.2009.2023544