DocumentCode
919618
Title
Dielectric films for capacitor applications in electronic technology
Author
Szedon, John R. ; Takei, W.J.
Author_Institution
Westinghouse Research Laboratories, Pittsburgh, Pa.
Volume
59
Issue
10
fYear
1971
Firstpage
1434
Lastpage
1439
Abstract
In microelectronic applications, various approaches have been used to provide high capacitance thin film components. None of these has been widely accepted for reasons that are both technical and economic. Limited applications have been made of silicon and other simple oxides, e.g., of aluminum or tantalum, as dielectric media. Particularly in the area of microwave integrated circuits, requirements for high frequency, high specific capacitance, low to moderate loss, and integrability call for new thin film approaches. These requirements will only be met by using more complex compounds, possibly of ferroelectric materials. Aspects of material preparation, composition evaluation, and dielectric performance of thin film bismuth titanates are treated in a manner which should be of value in considering other complex dielectrics for similar use. Of particular technological importance is the use of thin silica barrier layers at the metal electrodes to permit achieving low dielectric loss.
Keywords
Aluminum; Capacitance; Capacitors; Dielectric films; Dielectric losses; Dielectric thin films; Microelectronics; Microwave integrated circuits; Silicon; Thin film circuits;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1971.8451
Filename
1450381
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