• DocumentCode
    919618
  • Title

    Dielectric films for capacitor applications in electronic technology

  • Author

    Szedon, John R. ; Takei, W.J.

  • Author_Institution
    Westinghouse Research Laboratories, Pittsburgh, Pa.
  • Volume
    59
  • Issue
    10
  • fYear
    1971
  • Firstpage
    1434
  • Lastpage
    1439
  • Abstract
    In microelectronic applications, various approaches have been used to provide high capacitance thin film components. None of these has been widely accepted for reasons that are both technical and economic. Limited applications have been made of silicon and other simple oxides, e.g., of aluminum or tantalum, as dielectric media. Particularly in the area of microwave integrated circuits, requirements for high frequency, high specific capacitance, low to moderate loss, and integrability call for new thin film approaches. These requirements will only be met by using more complex compounds, possibly of ferroelectric materials. Aspects of material preparation, composition evaluation, and dielectric performance of thin film bismuth titanates are treated in a manner which should be of value in considering other complex dielectrics for similar use. Of particular technological importance is the use of thin silica barrier layers at the metal electrodes to permit achieving low dielectric loss.
  • Keywords
    Aluminum; Capacitance; Capacitors; Dielectric films; Dielectric losses; Dielectric thin films; Microelectronics; Microwave integrated circuits; Silicon; Thin film circuits;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1971.8451
  • Filename
    1450381