• DocumentCode
    919629
  • Title

    Characteristics of RF sputtered barium titanate thin films

  • Author

    Pratt, Isaac H.

  • Author_Institution
    U. S. Army Electronics Command, Fort Monmouth, N. J.
  • Volume
    59
  • Issue
    10
  • fYear
    1971
  • Firstpage
    1440
  • Lastpage
    1447
  • Abstract
    Results of a study on the deposition of thin-film barium titanate (BaTiO3) by RF sputtering are discussed. BaTiO3was deposited onto Pt foil and onto thin-film electrodes on various substrates, and counterelectroded to form metal-dielectrio-metal structures. Dielectrics were deposited at substrate temperatures from 23° to 1000°C, some of the dielectrics fired in air at temperatures up to 1400°C after deposition. On bulk Pt, the BaTiO3film matrix indicated an average grain size of 2000 Å after heat treatment Constant Ba/Ti ratios were measured for the films deposited over the entire substrate temperature range. Dielectric constants ranged from 16- 1900, the tan δ of the capacitors varying from 0.005 for amorphous films to 0.065 for polycrystalline films with highest dielectric constants. Effects of temperature and frequency on the capacitors and the charge-voltage and field dependence of the dielectric constant are described. Current-voltage relationships, breakdown strengths, and processing conditions indicate the potential of the capacitor structures for practical applications.
  • Keywords
    Barium; Capacitors; Dielectric constant; Dielectric substrates; Dielectric thin films; Electrodes; Radio frequency; Sputtering; Temperature; Titanium compounds;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1971.8452
  • Filename
    1450382