DocumentCode
919629
Title
Characteristics of RF sputtered barium titanate thin films
Author
Pratt, Isaac H.
Author_Institution
U. S. Army Electronics Command, Fort Monmouth, N. J.
Volume
59
Issue
10
fYear
1971
Firstpage
1440
Lastpage
1447
Abstract
Results of a study on the deposition of thin-film barium titanate (BaTiO3 ) by RF sputtering are discussed. BaTiO3 was deposited onto Pt foil and onto thin-film electrodes on various substrates, and counterelectroded to form metal-dielectrio-metal structures. Dielectrics were deposited at substrate temperatures from 23° to 1000°C, some of the dielectrics fired in air at temperatures up to 1400°C after deposition. On bulk Pt, the BaTiO3 film matrix indicated an average grain size of 2000 Å after heat treatment Constant Ba/Ti ratios were measured for the films deposited over the entire substrate temperature range. Dielectric constants ranged from 16- 1900, the tan δ of the capacitors varying from 0.005 for amorphous films to 0.065 for polycrystalline films with highest dielectric constants. Effects of temperature and frequency on the capacitors and the charge-voltage and field dependence of the dielectric constant are described. Current-voltage relationships, breakdown strengths, and processing conditions indicate the potential of the capacitor structures for practical applications.
Keywords
Barium; Capacitors; Dielectric constant; Dielectric substrates; Dielectric thin films; Electrodes; Radio frequency; Sputtering; Temperature; Titanium compounds;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1971.8452
Filename
1450382
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