Title :
Theoretical investigation of negative differential conductance regime of silicon nanocrystal single-electron devices
Author :
Sée, Johann ; Dollfus, Philippe ; Galdin, Sylvie
Author_Institution :
Centre Nat. de la Recherche Scientifique-Unite Mixte de Recherche, Univ. Paris, Orsay, France
fDate :
5/1/2006 12:00:00 AM
Abstract :
The current-voltage characteristics of metal-insulator-Si quantum dot (QD)-insulator-metal structures are numerically simulated to investigate the design and the possible applications of single-electron devices taking advantage of Coulomb-blockade phenomenon. The simulation technique is based on a physical description of the devices and only requires fundamental quantities of the system but no fitting parameter. One of the originality of this work lies in the accurate calculation of tunneling rates by a perturbation method, which allows us to properly include the effect of a bias voltage on the wave functions in the QD. As a consequence, we show that the bias influence on the wave function may lead to negative-differential-conductance effects depending on the design of the structure.
Keywords :
Coulomb blockade; MIS structures; electric admittance; nanostructured materials; semiconductor quantum dots; silicon; single electron devices; Coulomb-blockade phenomenon; Si; metal-insulator-silicon quantum dots; nanocrystal single-electron devices; negative differential conductance; perturbation method; silicon single-electron devices; tunneling rates; wave functions; Current-voltage characteristics; Metal-insulator structures; Nanocrystals; Numerical simulation; Perturbation methods; Quantum dots; Silicon; Single electron devices; Tunneling; Wave functions; Coulomb blockade; single-electron devices; tunneling;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2006.871875