• DocumentCode
    919830
  • Title

    A V-Band CMOS VCO With an Admittance-Transforming Cross-Coupled Pair

  • Author

    Hsieh, Hsieh-Hung ; Lu, Liang-Hung

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
  • Volume
    44
  • Issue
    6
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    1689
  • Lastpage
    1696
  • Abstract
    A novel circuit topology suitable for the implementation of CMOS voltage-controlled oscillators (VCOs) at millimeter-wave frequencies is presented in this paper. By employing transmission line segments to transform the admittance of the additional cross-coupled pair, the proposed LC-tank VCO can sustain fundamental oscillation at a frequency close to the fmax of the transistors. Using a standard 0.18 mum CMOS process, a V-band VCO is realized for demonstration. The fabricated circuit exhibits a frequency tuning range of 670 MHz in the vicinity of 63 GHz. The measured output power and phase noise at 1 MHz offset are -15 dBm and -89 dBc/Hz, respectively. Operated at a 1.8 V supply voltage, the VCO core and the output buffer consume a total DC current of 55 mA.
  • Keywords
    CMOS integrated circuits; millimetre wave integrated circuits; millimetre wave oscillators; phase noise; voltage-controlled oscillators; V-band CMOS VCO; admittance-transforming cross-coupled pair; circuit fabrication; circuit topology; frequency 670 MHz; millimeter-wave frequency; phase noise; size 0.18 mum; transmission line segment; voltage 1.8 V; voltage-controlled oscillator; Admittance; CMOS process; Circuit optimization; Circuit topology; Distributed parameter circuits; Frequency; Millimeter wave circuits; Millimeter wave transistors; Power transmission lines; Voltage-controlled oscillators; Admittance transforming; LC-tank oscillators; coplanar waveguide; maximum oscillation frequency; millimeter wave; phase noise; quality factors; voltage-controlled oscillators;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2009.2020203
  • Filename
    4982873