Title :
A 35-GS/s, 4-Bit Flash ADC With Active Data and Clock Distribution Trees
Author :
Shahramian, Shahriar ; Voinigescu, Sorin P. ; Carusone, Anthony Chan
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON
fDate :
6/1/2009 12:00:00 AM
Abstract :
This paper presents a 35-GS/s, 4-bit flash ADC-DAC with active data and clock distribution trees. At mm-wave clock frequencies, skew due to mismatch in the clock and data distribution paths is a significant challenge for both flash and time-interleaved converter architectures. A full-rate front-end track and hold amplifier (THA) may be used to reduce the effect of skew. However, it is found that the THA output must then be distributed to the comparators with a bandwidth greater than the sampling frequency in order to preserve the flat regions of the track and hold waveform. Instead, if the data and clock distribution have very low skew, the THA can be omitted thus obviating the associated nonlinearities and resulting in improved performance. In this work, a tree of fully symmetric and linear BiCMOS buffers, called a ldquodata treerdquo, distributes the input to the comparator bank with a measured 3-dB bandwidth of 16 GHz. The data tree is integrated into a complete 4-bit ADC including a full-rate input THA that can be disabled and a 4-bit thermometer-code DAC for testing purposes. The chip occupies 2.5 mm times 3.2 mm including pads and is implemented in 0.18 mum SiGe BiCMOS technology. The ADC consumes 4.5 W from a 3.3 V supply while the DAC operates from a 5 V supply and consumes 0.5 W. The ADC has 3.7 ENOB with a 3-dB effective resolution bandwidth of 8 GHz and a full-scale differential input range of 0.24 Vpp. With the THA enabled, the performance degrades rapidly beyond 8 GHz to less than 1-bit, but with the THA disabled, the ENOB remains better than 3-bits for inputs up to 11 GHz with an SFDR of better than 26 dB.
Keywords :
BiCMOS integrated circuits; analogue-digital conversion; clocks; flash memories; sample and hold circuits; active data; bandwidth 3 GHz; bandwidth 8 GHz; clock distribution tree; comparator bank; data distribution path; flash ADC; full-rate front-end track and hold amplifier; fully symmetric BiCMOS buffers; linear BiCMOS buffers; mm-wave clock frequencies; power 0.5 W; power 4.5 W; sampling frequency; size 2.5 mm; size 3.2 mm; thermometer-code DAC; time-interleaved converter architecture; voltage 3.3 V; voltage 5 V; word length 4 bit; Bandwidth; BiCMOS integrated circuits; Clocks; Degradation; Frequency conversion; Germanium silicon alloys; Sampling methods; Semiconductor device measurement; Silicon germanium; Testing; Active clock distribution; BiCMOS amplifiers; DSP-based equalizers; SiGe BiCMOS HBT; active data distribution; analog to digital converter (ADC); digital to analog converter (DAC); flash data converters; mm-wave data converters; track and hold amplifier (THA); transimpedance amplifier (TIA);
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2009.2020657