• DocumentCode
    920037
  • Title

    DGS pattern with enhanced effective capacitance

  • Author

    Wong, C.C. ; Free, C.E.

  • Author_Institution
    Adv. Technol. Inst., Surrey Univ., Guildford, UK
  • Volume
    42
  • Issue
    8
  • fYear
    2006
  • fDate
    4/13/2006 12:00:00 AM
  • Firstpage
    470
  • Lastpage
    471
  • Abstract
    A new defected ground structure (DGS) pattern with enhanced effective capacitance is presented. The increase in effective capacitance enables the new DGS pattern to achieve a lower resonance than the dumb-bell shaped DGS pattern for the same etched square area dimension. Simulation and experimental results show that a 1.32 GHz lower resonance is achieved with the new DGS pattern, compared to a dumb-bell shaped DGS pattern.
  • Keywords
    capacitance; etching; microstrip lines; 1.32 GHz; DGS pattern; defected ground structure; effective capacitance;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20060316
  • Filename
    1624753
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=920037