• DocumentCode
    920044
  • Title

    Accumulation transit mode in transferred-electron oscillators

  • Author

    Jones, David ; Rees, H.D.

  • Author_Institution
    Royal Radar Establishment, Great Malvern, UK
  • Volume
    8
  • Issue
    23
  • fYear
    1972
  • Firstpage
    566
  • Lastpage
    567
  • Abstract
    Computer simulations have been used to analyse device characteristics appropriate to an accumulation-layer transit mode. Data for GaAs, previously attributed to the limited-space-charge-accumulation mode, and for indium phosphide, are identified with accumulation transit oscillations.
  • Keywords
    Gunn oscillators; computer aided analysis; electronics applications of computers; gallium arsenide; indium compounds; simulation; solid-state microwave devices; transferred electron devices; 35 to 40 GHZ; GaAs; Gunn oscillators; InP; accumulation transit mode; computer simulation; microwave oscillators; transferred electron devices;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19720411
  • Filename
    4235876