Title :
Scan-modulation system for improved spatial displays in scanning-electron-probe X ray microanalysis
Author :
Ward, E.W. ; Weeks, R.
Author_Institution :
Post Office, Research Station, London, UK
Abstract :
Improved display of areas of interest is achieved by modulating the line-scan speed so that areas of higher count rate are scanned more slowly. The sensitivity to differences in element concentration is enhanced, and location and identification of small particles and inclusions is greatly facilitated.
Keywords :
X-ray chemical analysis; cathode-ray tube displays; electron probe analysis; modulation; CRT displays; scan modulation system; scanning electron probe X-ray microanalyser; spatial displays;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19720448
