Title :
Surface-resistance measurements of thin conducting films at 10 GHz
Author :
Butlin, R.S. ; McPhun, M.K.
Author_Institution :
University of Warwick, Department of Engineering, Coventry, UK
Abstract :
The letter describes a technique for calibration of an H011 cavity for surface-resistance measurements of thin-film and bulk samples at 10 GHz. After calibration and insertion of the sample, it is only necessary to measure the return loss or v.s.w.r. at resonance. The conductivity and surface resistance of the sample may then be read directly from a graph.
Keywords :
calibration; cavity resonators; microwave measurement; resistance measurement; thin films; calibration; cavity resonators; conductivity; microwave measurements; resistance measurements; surface phenomena; thin films;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19720461
