Title :
Edge-adaptive Demosaicking for Artifact Suppression Along Line Edges
Author :
Lee, Chulhee ; Jeong, Taeuk ; Lee, Chulhee
Author_Institution :
Yonsei Univ., Seoul
Abstract :
In this paper, we present an edge-adaptive demosaicking method for artifact suppression along line edges. Although various demosaicking methods have been proposed, they still suffer from artifacts along line edges. In order to suppress these undesirable artifacts, the proposed method first determines the pattern of line edges and interpolates missing pixels along the detected direction during initial interpolation. Then, refinement and calibration processes are carried out in series to improve image quality. Experimental results demonstrate that the proposed method produces visually pleasing images and outperforms existing demosaicking methods in terms of the peak signal-to-noise ratio (PSNR) and the mean squared error of S-CIELAB.
Keywords :
image enhancement; interpolation; S-CIELAB; artifact suppression; calibration process; edge-adaptive demosaicking; image quality; line edges; mean squared error; peak signal-to-noise ratio; refinement process; CMOS image sensors; Calibration; Color; Digital cameras; Filters; Frequency; Image edge detection; Image quality; Interpolation; Sensor arrays;
Journal_Title :
Consumer Electronics, IEEE Transactions on
DOI :
10.1109/TCE.2007.4341588