Title :
Experimental studies of bistatic scattering from two-dimensional conducting random rough surfaces
Author :
Chan, Tsz-King ; Kuga, Yasuo ; Ishimaru, Akira ; Le, Charlie T C
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
fDate :
5/1/1996 12:00:00 AM
Abstract :
Despite the recent development of analytical and numerical techniques for problems of scattering from two-dimensional rough surfaces, very few experimental studies were available for verification. The authors present the results of millimeter-wave experiments on scattering from two-dimensional conducting random rough surfaces with Gaussian surface roughness statistics. Machine-fabricated rough surfaces with controlled roughness statistics were examined. Special attention was paid to surfaces with large rms slopes (ranging from 0.35 to 1.00) for which enhanced backscattering is expected to take place. Experimentally, such enhancement was indeed observed in both the copolarized and cross-polarized returns. In addition, it was noticed that at moderate angles of incidence, the scattering profile as a function of observation angle is fairly independent of the incident polarization and operating frequency. This independence justifies the use of the geometric optics approximation embodied in the Kirchhoff formulation for surfaces with large surface radius of curvature. When compared with the experimental data, this analytical technique demonstrates good agreement with the experimental data
Keywords :
electromagnetic wave scattering; geophysical techniques; radar cross-sections; radar polarimetry; remote sensing by radar; EHF; Gaussian surface roughness statistics; Kirchhoff formulation; bistatic scattering; experimental study; geometric optics approximation; geophysical measurement technique; land surface; millimeter-wave; mm wave; polarization; polarized; radar polarimetry; radar remote sensing; radar scattering; rough surface; terrain mapping; two-dimensional conducting random rough surfaces; Backscatter; Data analysis; Frequency; Geometrical optics; Millimeter wave technology; Optical polarization; Optical scattering; Rough surfaces; Statistics; Surface roughness;
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on